Nonvolatile memory

ABSTRACT

A nonvolatile memory cell which is highly scalable includes a cell formed in a triple well. A pair of sources for a pair of cells on adjacent word lines each acts as the emitter of a lateral bipolar transistor. The lateral bipolar transistor of one cell operates as a charge injector for the other cell. The charge injector provides carriers for substrate hot carrier injection onto a floating gate.

This is a divisional of prior Application No. 09/440,360 filed Nov. 15,1999, U.S. Pat. No. 6,088,263, which is a continuation-in-part anddivisional of prior Application No. 09/189,249 filed Nov. 10, 1998, U.S.Pat. No. 6,026,017, which is a continuation-in-part of prior ApplicationNo. 08/838,854 filed Apr. 11, 1997, U.S. Pat. No. 5,867,425.

BACKGROUND

This invention relates generally to nonvolatile memories andparticularly to electrically erasable nonvolatile memories.

Nonvolatile memory cells are advantageous since they retain recordedinformation even when the power to the memory is turned off. There areseveral different types of nonvolatile memories including erasableprogrammable read only memories (EPROMs), electrically erasable andprogrammable read only memories (EEPROMs) and flash EEPROM memories.EPROMS are erasable through light exposure but are electricallyprogrammable by channel hot electron injection onto a floating gate.Conventional EEPROMs have the same programming functionality, butinstead of being light erasable they can be erased and programmed byelectron tunneling facilitated by an on-chip electrical signal. Thus,information may be stored in these memories, retained when the power isoff, and the memories may be erased for reprogramming, as necessary,using appropriate techniques. Flash EEPROMs may be block erased,typically giving them better read access times than regular EEPROMs.

Currently, flash memories have gained considerable popularity. Forexample, flash memories are often utilized to provide on-chip memory formicrocontrollers, modems and SMART cards and the like where it isdesirable to store codes that may need fast updating.

While flash memories and EEPROMs are closely related, in many instances,flash memories are preferred because their smaller cell size means thatthey can be made more economically. However, flash memories and EEPROMsoften have very similar cell attributes.

Nonvolatile memory cells differ in certain respects from the transistorsthat are generally utilized in electronic components called logicdevices, such as microcontrollers, that work with the memory cells.Logic devices are formed of transistors that use a single gateelectrode. Nonvolatile memories usually include two gate electrodes,known as the control and floating gate electrodes, situated one adjacentto the other. Because of this structural difference, nonvolatilememories and logic devices may be made by different processes. This maycontribute to a substantial increase in process complexity andmanufacturing cost when the two components need to be placed togetherinto the same chip.

Particularly with an EEPROM, the electrical programming of the cellsnormally requires substantial potentials to be applied to the cells.These potentials induce electron tunneling from an N+ region onto thefloating gate. Additional complexity may arise from the need to providesubstantially larger voltages to memory cells than are needed for normallogic transistor operation.

While the industry has come to accept the need for separate processtechnologies for logic and nonvolatile memories and while those in theindustry have also come to appreciate that significant currents areneeded to program flash EEPROMS, there would be a substantial demand fora nonvolatile memory which was both electrically erasable andprogrammable without the need for special process technologies or forrelatively higher programming voltages and higher currents.

Furthermore, with the conventional flash EEPROMs, the electricalprogramming of the cells normally requires high current to be applied tothe cells. A very minute fraction of this electron current becomesinjected from the drain depletion region onto the floating gate. Thismeans that the injection efficiency of such devices is low (e.g., 1×10⁻⁶to 1×10⁻⁹). The requirement of high current adds additional complexitybecause of the design of the high current pump operated at low voltage.

SUMMARY

In accordance with one embodiment, a memory array including word linesand bit lines includes a first and second cell, each having a controlgate, floating gate and a source formed in a substrate. The control gateis situated over the floating gate. The cells are each adapted to form adepletion region in the substrate. A drain is situated between the firstand second cells, each of the cells being part of a different word line.

Other aspects are set forth in the accompanying detailed description andclaims.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a schematic depiction of an array configuration for oneembodiment;

FIG. 2 is a cross-sectional view taken generally along the line 3-3 inFIG. 3;

FIG. 3 is a greatly enlarged, top plan view showing the layout of asemiconductor implementation of the embodiment shown in FIG. 1;

FIG. 4 is a partial three dimensional view of the cell shown in FIG. 3;

FIG. 5 is a cross-sectional view of another embodiment; and

FIG. 6 is a greatly enlarged cross-sectional view of the drain implant;

FIG. 7 is a greatly enlarged cross-sectional view of the source implant;and

FIG. 8 is a greatly enlarged cross-sectional view of the logic deviceimplanted by the source implant.

DETAILED DESCRIPTION

Referring to the drawing wherein like reference characters are used forlike parts throughout the several views, a pair of memory cells 10 a and10 b, shown in FIG. 1, are located in two adjacent word lines 12 a and12 b. The cells 10 are both arranged on the same bit line 14. Othercells 16, 18, and 20 are arranged on bit lines 22, 24, and 26 and wordlines 12. This structure is advantageously implemented on asemiconductor layer having situated thereon electrically isolatedfloating gates 28.

The source terminal 30 of each cell 10, 16, 18 and 20 is controlled by asource 32 or 34. The control gates 36 a and 36 b of the cells 10, 16, 18and 20 are controlled by the word lines 12. The drains 38 of the cellsare connected to the bit lines 14, 22, 24 and 26.

One layout for implementing a pair of cells 10, shown in FIG. 3,includes a pair of control gates 36 a and 36 b. The same layout may beused for the other pairs of cells 16, 18 and 20. The control gates 36extend across a field oxide isolation region 40 which is bordered by thedrain 38 on one side and the source 32 and 34 on the other side. Thefloating gates 28 a and 28 b are situated in isolation under the controlgates 36 a and 38 a, over the oxide isolation region 40 a.

In the embodiment illustrated in FIG. 2, the active areas under the bitlines are P-type semiconductor material and are part of a P-well 44. TheP-well 44 in turn is formed in an N-well 46. Finally, the N-well 46 isformed in a P-type substrate 48. The P-well 44 may be biased, asindicated at 50 through a heavily doped P-type contact 52, and theN-well 46 may be biased, as indicated at 54.

Each floating gate 28 forms a tunneling capacitor 57 by its interactionwith the channel 58. A tunnel dielectric 56 separates the floating gate28 from the channel 58. Similarly the interpoly dielectric 60 which ispart of a coupling capacitor 61, separates the floating gate 28 from thecontrol gate 36. Finally, the control gate 36 is separated by thedielectric 62 from the channel 64.

The physical relationship of the cells 10, 16, 18 and 20 is illustratedin FIG. 3. The floating gates 28 are shown in dashed lines. Similarly,the control gates 36 span between the drain 38 and a source 32 or 34.Drain contacts 42 are located between the control gates 36 and bit lines14, 22, 24 and 26. Bit lines 14, 22, 24 and 26 extend transversely tothe control gates 36.

The cell 10 may be described as a flash EEPROM utilizing high efficiencysubstrate hot electron injection for erasure and Fowler-Nordheimtunneling for programming. The process of substrate hot electroninjection is well described in T. H. Ning, C. M. Osburn, and H. W. Yu,“Emission Probability of Hot Electrons from Silicon into SiliconDioxide,” J. Appl. Phys., vol. 48, p. 286 (1977); Boaz Eitan, James L.McCreary, Daniel Amrany, Joseph Shappir, “Substrate Hot-electronInjection EPROM,” IEEE Transactions on Electron Devices, Vol. ED-31, No.7, p. 934 (July 1984); I. C. Chen, C. Kaya, and J. Paterson,“Band-to-Band Tunneling Induced Substrate Hot-electron (BBISHE)Injection: A New Programming Mechanism for Nonvolatile Memory Devices,”IEDM (1989) p. 263; and C. Y. Hu, D. L. Kencke, S. K. Benerjee,“Substrate-current-induced Hot Electron (SCIHE) Injection: A NewConvergence Scheme for FLASH Memory,” IEDM (1995), P. 283. Each of thesearticles is hereby expressly incorporated by reference herein.

The cells are erased by causing charge to accumulate on the floatinggates 28 and programming is achieved when charge is removed from thefloating gates. Thus, initially all of the cells have accumulatedcharges on their floating gates. All of the cells 10, 16, 18, and 20 areerased together using block erasing.

Erasing is achieved by high efficiency substrate hot carrier injection.As indicated in FIG. 2, substrate carriers such as the electrons,indicated by the arrows at 66, may be generated by forward biasing asource 32 or 34. That is, the source of one cell acts as the injectorfor the other cell of a pair of cells 10, 16, 18, or 20. Thus, thesource 32 acts as an injector for the cell 10 b being erased in FIG. 2.Similarly, the source 34 acts an injector for the cell 10 a when thecell 10 a is being erased.

The source 32 is separated from the cell lob by the channels 64 a and 58and the drain 38. Some of the substrate electrons 66 diffuse throughthese regions to the channel region 56 b underneath the cell 10 b. Someelectrons are ineffectively taken by the drain 38.

For cells that need to be erased, the channel region 56 b may be biasedsuch that a depletion region is formed. When an electron gets to thedepletion region, it is accelerated by an electric field, V_(CS). Theelectric field V_(CS) is the difference between the channel potential(potential of the surface inversion region) and the P-well 44 potential.Some of these electrons gain sufficient energy, in excess of theeffective oxide barrier height potential, to be injected onto thefloating gate 28 b.

For cells that are not to be erased, the channel-to-P-well potential isless then the effective oxide barrier height. In such case, theelectrons would not gain sufficient energy to overcome the barrierheight and are not injected onto the floating gate 28.

In the case when flash erase is desired, a scheme exists where all thecells inside the same P-well can be erased together. This is achieved byforward-biasing the P-well 44 with respect to the N-well 46. Electronsare injected from the bottom of the P-well 44 as indicated by the arrows80, and are collected by either the floating gate or the drain as shownin FIG. 5.

The heavily doped N-type source 32, the channel region 56 a and 64 aunder the cell 10 a, the region under the drain 38, and the channelregion 56 b under the cell form a lateral bipolar transistor 68. Theemitter (source 32) of the bipolar transistor 68 acts as a chargeinjector, injecting substrate electrons from the source to the biaseddepletion region 56 b under the floating gate 28 b. With the source 32as the emitter and the region 58 a, 56 a and the region under the drain38 as the base, the collector is the biased depletion region 56 b.

A compact cell layout is achieved because separate select transistorsare unnecessary and the drain 38 acts as the drain for two adjacentcells in a pair of cells. The source of one cell also acts as theefficient injector for the other cell of a pair.

The efficiency of substrate hot electron injection is a function of anumber of characteristics. Considering the depletion region 56 b,electrons scatter with lattice phonon scattering across the depletionregion with a certain electron mean free path. Some of these electrons,without much scattering, gain sufficient energy to overcome theeffective barrier height and are injected onto the floating gate 28.Some electrons gain less energy than the effective barrier height andare not injected onto the floating gate 28. The injection efficiency isa strong function of the doping concentrations and the channel-to-P-wellpotential, V_(CS).

Since the cell 10 is situated in a P-well 44 embedded in an N-well 46,during erasing the floating gate 28 is capacitively coupled to a highvoltage by raising the potential on the bit lines, which may be biasedto a potential from 7 to 14 volts. The voltage that the floating gate 28attains at low drain bias is approximately a function of the voltage onthe floating gate when the control gate 36 b and the P-well 44 and drain38 are at ground, plus the coupling ratio times the voltage on thecontrol gate 36 b. The coupling ratio, to a first order, isapproximately equal to the capacitance of the coupling capacitor 61divided by the sum of the capacitances of the coupling capacitor 61 andthe tunneling capacitor 57.

When the cell 10 a is off, the drain 38 potential can be forced close tothe supply potential V_(CC) or higher. The channel 56 b potential, whichis the potential of the surface inversion region of the channel region,is set as follows. When the potential of the floating gate 28 (Vfg) isone cell threshold voltage higher than the drain 38 potential, thechannel potential is the same as the drain potential. On the other hand,when the floating gate 28 potential is less than the drain 38 potentialplus the cell threshold voltage, the channel potential is the differencebetween the floating gate 28 voltage and the cell threshold voltage.

The P-well potential is the voltage 50 applied to the P-well 44. TheP-well 44 is embedded in an N-well 46, and the N-well is set at avoltage 54 of approximately V_(SS) or higher, such as V_(CC). Thus, theP-well potential can be V_(SS) or negative, typically negative one tonegative two volts. Moreover, P-well potential is usually less than theeffective oxide barrier height to avoid any potential disturb problem.

The potential difference between the and the P-well 44 potential 50 isthe voltage across the depletion region. For cells to be erased, thedrain 38 voltage is raised high, typically close to V_(CC) or higher. Adepletion region underneath the cell being erased is formed with avoltage drop equal to the channel potential minus the P-well potential50.

For those cells that are not to be erased, the unselected word linevoltage may be set to zero volts (V_(SS)). The voltage drop across thedepletion region then is less than the effective oxide barrier height.

Cell 10 programming is achieved by Fowler-Nordheim tunneling ofelectrons from the floating gate 28 to the channel region 56 b and thedrain 38. During programming, the selected bit line 36 b is forced to ahigh voltage “H” (higher than V_(CC)) of about 5 volts, for example. Theunselected bit lines are maintained at V_(SS) (external ground). If theN-well and P-well are maintained at V_(CC) and V_(SS) respectively, theelectric field across the junction between the drain 38 and the P-well44 may be reduced. The reduced field prevents acceleration of hot holetrapping in the gate oxide under the floating gate 28. Electrons tunnelto the drain 38 (drain programming). The tunneling current depends onthe voltage from the floating gate 28 to the drain 38.

Reading the programming state of a cell may be accomplished as follows.The selected bit line is biased to approximately 0.7 to one volt. Therest of the bit lines are allowed to float. The source 32 may be biasedto −V_(S) and the source 34 may be biased to V_(SS). The selected wordline is biased to V_(HH) and the adjacent word line is biased to V_(SS).The P-well is biased to V_(SS) and the N-well is biased at V_(CC).

When these potentials are applied to the selected cell 10, a currentflows through the cell. This current is then fed to a current senseamplifier (not shown). If the voltage on the floating gate 28 is greaterthan the threshold voltage on the sense transistor 12, a higher current,perhaps greater than 20 microamps, is detected as the conducting state.When the potential of the floating gate is less than the thresholdvoltage, a lower current, for example, less than one microamp flows, anda nonconducting state is detected.

A detected conducting state can be called a one state. A nonconductingstate can be called the zero state.

During erasing, the source 32 is biased to −V_(S) (i.e., a diode voltagedrop, approximately 0.7 volts, for example) while the source 34 is atV_(HH). V_(HH) may be from about 10 to 14 volts in one embodiment. Theselected word line is biased to V_(HH) and the adjacent word line of thepair is −V_(S). The P-well bias is −V_(SS) and the N-well bias isV_(CC).

The voltage across the capacitor 57 is the difference between thefloating gate 28 potential on the one hand and the drain 38 and theP-well 44 potentials. When the difference exceeds 8 to 10 volts,sufficient tunneling current is generated and the floating gate 28 canbe erased to a negative potential in the time frame of a fewmilliseconds to a few seconds, depending on the tunneling oxide 56thickness.

A suitable on-chip circuit for generating two negative bias potentials,one to bias a word line 36 and the other to negatively bias the P-well44, can be found in L. A. Glasser and D. W. Dobberpuhl, “The Design andAnalysis of VLSI Circuits,” (December 1985), published byAddison-Wesley, at pages 301-329, hereby expressly incorporated byreference herein.

The cells in the array may be formed using conventional processtechnologies such as double poly, single metal CMOS process. Theillustrative parameters set forth herein contemplate a 0.25 m or lowerfeature size with V_(CC) potentials of 1.8 volts. As the technologypermits lowering voltages and smaller feature sizes, the parametersherein would scale accordingly.

The starting substrate material is typically P-type (100) silicon, forexample having a resistivity in the range of 10-20 ohm-cm. The P-well 44is embedded in an N-well 46 in the so-called triple well process. TheP-well 44 has a typical well depth of, for example, 2 to 4 um with anaverage doping concentration, for example, in the range of 1×10¹⁶ to5×10¹⁶ atoms per cubic centimeter.

The N-well 46 has a typical well depth of, for example, 4-8 um. Thedoping concentration may be from 4×10¹⁵ to 1×10¹⁶ atoms per cubiccentimeter. The triple well is formed by the P-well 44 counterdoping theN-well 46.

The formation of the elements in the triple well is as follows. AnN-well implant is done, for example, with phosphorous 31 with a typicaldose of 1 to 1.5×10¹³ atoms per square centimeter and an energy of 160to 100 Kev. The N-well 46 is then counterdoped with a P-well implant.Typical dosages for the P-well implant could be 1.5 to 2.5×10¹³ atomsper square centimeter with an energy of 30 Kev to 180 Kev using aspecies such as boron 11. The N-well 46 and P-well 28 are then driven,typically 6 to 10 hours at 1125 to 1150° C. This sets the wells to thedesired doping concentrations and depths.

After the well formation, standard logic field oxide formation andchannel stop formation steps are applied. The field oxide thickness andimplant doses are adjusted to achieve a field threshold of 7 to 14volts, which is determined by the level for programming and erasing andby logic process capability. After this formation, a memory cell implantmay be performed. For example, a B11 implant at 30 to 50 Kev with a doseof 1.5 to 3×10¹³ atoms per square centimeter may be done through asacrificial oxide. The gate oxide 62 a and the tunnel oxide 56 are thenformed. For example, an 85 to 100 Angstrom dry oxide may be grown acrossthe wafer. A dry oxide is grown, for example, at 900° C. in partialoxygen followed by a 975 to 1050° C. anneal.

The floating gate 28 may then be formed of polysilicon, silicide ormetals. If polysilicon is used, it can be 1600 Angstroms thick, andPOCL3 doped at 870 to 1000° C. An interpoly dielectric is formed of anoxide-nitride-oxide sandwich (ONO) with the lower oxide being from 60 to80 Angstroms, the nitride layer having a thickness of from 90 to 180Angstroms and the upper oxide being from 30 to 40 Angstroms.

After floating gate 28 definition, an N+ implant I₁ is implanted intothe drain side of the device, as shown in FIG. 6. The implant I₁ may besubjected to prolonged temperature cycles to form the memory junction.The N+ implant can be, for example, a phosphorous implant at 60 Kev, ata dose of 1 to 3×10¹⁴ atoms per square centimeter and may be followed byan arsenic implant at 60 Kev, 2.5 to 4.5×10¹⁵ atoms per squarecentimeter. It is also possible to form the source and drain usinglightly doped drain (LDD) technology.

A polysilicon (poly 2) for the control gate may then be deposited andsilicided if desired. The control gate need not be aligned to eitheredge of the floating gate. The control gate may be self-aligned to thesource, as shown in FIG. 7. The gates are patterned and defined. Thecontrol gate need not be self-aligned to the floating gate on the sourceor the drain sides.

After control gate 36 definition, an N+ source/drain implant I₂ may beself-aligned to the control gate in conjunction with the formation ofsources in the case of memory devices as shown in FIG. 7 and sources anddrains in the case of logic devices as shown in FIG. 8. Thus, the memorycontrol gate forms a gate 88 of the logic devices. At the same time asource region 84 receives the implant I₂ with the drain covered by amask 86.

A resist on resist process may be used to protect the interlayerdielectrics such as an oxide-nitride-oxide (ONO) layer and the floatinggate from drain implant contamination. The resist used to define thefloating gate may be maintained and additional resist may be added toform a composite resist layer 82 to protect logic devices from thememory device drain implant. Advantageously, any additional resist usedto form the composite resist 82 is spaced back from the drain edge toprevent any shadowing during the drain implant.

With the completion of these capacitor and transistor structures, allsubsequent processing for contacts and interconnect layers followsstandard logic rear end processing.

Referring again to FIG. 3, the flow of electron current from theinjector, which in the illustrated embodiment is the source 32, to afloating gate 28 b is shown. The substrate electrons, indicated byarrows, may flow from the source 32 along the entire width “W” of thecell between adjacent isolation regions 40. In addition, electrons flowfrom the portions 32 a and 32 b extending beyond the cell width. Namely,the portions of the source 32 extending to either side of the cell inthe width direction also contribute electrons which may be utilized toprogram the floating gate 28. This may significantly increase theavailable electron current for erasing and thus may expedite erasing.

This arrangement is possible because the heavily doped N-type sources 32and 34 run parallel to the control gates 36. In other words, the sources32 and 34 run parallel to the word lines or rows of the array. Becauseof this geometry, a portion of the source which is greater in lengththan the width of the cell may be utilized for erasing purposes. Namely,additional electrons may flow from the extensions 32 a and 32 b betweenadjacent columns of cells.

The operation of one embodiment of the invention is illustrated in thefollowing mode table:

Next to Selected Unselected Source Source Selected Selected B/L B/L 1 2WL WL Erase H H −V_(S) V_(H) − V_(S )  V_(HH) Prog. H V_(SS) Float FloatV_(SS) −V_(HH)  Read .7-1.0 V Float −V_(S) V_(SS) V_(SS) V_(HH) Flash HH −V_(S) −V_(S )  V_(HH) V_(HH) Erase

While a number of parameters and levels were provided in the foregoingdescription, those skilled in the art will appreciate that theseparameters and levels are merely for illustration purposes. For example,by reversing the conductivity types of the doped junctions and the biaspolarities, a cell structure using substrate hot hole injection may beimplemented. In addition, charge injection may be used for programmingrather than erasing as disclosed in the illustrated embodiment. It isintended that the appended claims cover all modifications and variationsas fall within the true spirit and scope of the present invention.

While the present invention has been described with respect to a limitednumber of embodiments, those skilled in the art will appreciate numerousmodifications and variations therefrom. It is intended that the appendedclaims cover all such modifications and variations as fall within thetrue spirit and scope of this present invention.

What is claimed is:
 1. A method comprising: defining a pair of spacedapart floating gates over a substrate; forming a drain by implantationbetween said floating gates; self-aligning said implantation to saidfloating gates; and forming a control gate over at least one of thefloating gates after said implantation.
 2. The method of claim 1including protecting said floating gates from said implantation.
 3. Themethod of claim 2 including using a resist on resist process to protectsaid floating gates.
 4. The method of claim 1 including self-aligning asource implant to said control gate.
 5. The method of claim of claim 4including avoiding self-alignment between said floating gate and asource.
 6. The method of claim 1 including causing said control gate tooverlap said substrate between said floating gate and a source.
 7. Themethod of claim 1 including avoiding self-alignment between said controlgate and said drain.